Characterization of Bismuth Titanate by Line Profile Analysis

Abstract

Bismuth Titanate (BIT), Bi₄Ti₃O₁₂, was synthesized using the solid-state reaction process from the oxide mixture of Bi₂O₃CO₃ and TiO₂. The characterization analysis of the prepared sample was done by X-ray diffraction technique. The X-ray diffraction data revealed an orthorhombic perovskite phase that was clearly explained. The Scherrer method, modified W-H analysis, and the SSP studies were conducted to figure out the crystallite size and micro strain in Bi₄Ti₃O₁₂. Morphological studies included SEM and TEM analysis.  FTIR spectral investigation supports the M-O coordination of the synthesized Bi₄Ti₃O₁₂ sample. The phase formation patterns of Bi₄Ti₃O₁₂ determined by different methods are highly connected.