R. GURUNADHA, et al. Analysis of Fault Detection in Analog Circuits Using WSF-SKC Optimized SVM Technique. International Journal on Recent and Innovation Trends in Computing and Communication, [S. l.], v. 11, n. 9, p. 4759–4766, 2024. DOI: 10.17762/ijritcc.v11i9.10028. Disponível em: https://www.ijritcc.org/index.php/ijritcc/article/view/10028. Acesso em: 2 oct. 2025.